The 15th IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

490 / 2019-02-28 15:35:19

Design of IGBT Accelerated Aging Test Platform Based on Saturation Voltage

Ageing; Power cycle; DC Accelerated Aging Platform;

Plenary track > Power Electronics

With the extensive use of IGBT power modules in many fields, reliability evaluation and life prediction have become very important research topics. Due to the long natural aging life of IGBT devices, it is necessary to accelerate the aging process of IGBTs by means of power cycle accelerated aging test platform, in order to clarify the IGBT failure mechanism in a short time. Therefore, in order to comprehensively observe and explore the fatigue aging failure process of power modules, this paper proposes a DC accelerated aging test platform capable of simultaneously accommodating multiple IGBT modules for power cycle test independently, which provides the subsequent influence of the junction temperature and aging on the composite trajectory of the module. The platform foundation.