The 15th IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

596 / 2019-03-15 20:28:17

An Adaptive Single Event Upset(SEU)-Hardened Flip-Flop Design

single event upset (SEU), flip-flop, radiation hardening

Plenary track > Device and Circuit Reliability

In this paper, a new radiation hardened flip-flop design technique is proposed. The structure provides an possibility that the D-type flip-flop can be configured as an Single Event Upset (SEU) hardened or non-hardened flip-flop in a circuit based on the logic states of the sensitive nodes with RC filtering structure being involved or not, considering speed and reliability. The proposed structure makes itself more widely used in both space, defense applications and high-performance terrestrial applications. Spice simulation results show that the flip-flop has good performance of SEU-hardness and flexibility.