Defect Detection in Terahertz Images by the Enhanced YOLOv8 Network
ID:14 View Protection:ATTENDEE Updated Time:2025-06-10 11:56:08 Hits:264 Oral Presentation

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Abstract
Terahertz defect detection plays a crucial role in various industrial applications, where accurate and efficient identification of small defects is challenging. In this study, we propose an enhanced version of YOLOv8 tailored for terahertz defect detection, incorporating key innovations to address the challenges posed by small and densely packed defects. Our model integrates a P2 layer for improved small object detection, Outlook Attention for contextual awareness, and ODConv for adaptive convolutions. To support model development and evaluation, we constructed a customized dataset using dual-material 3D-printed samples with diverse defect morphologies, captured via a QCL-based THz imaging system. Our enhanced model achieves a mAP@0.75 of 0.724 and a mAP@0.5–0.95 of 0.625, outperforming the YOLOv8 baseline by 11.0% and 3.3%, respectively, and surpassing even robust YOLO versions like YOLOv9 and YOLOv10. Visual comparisons further highlight the enhanced detection accuracy, with high confidence scores and few missed detections, particularly for small defects. These results demonstrate that our approach is highly effective for terahertz defect detection.
Keywords
Terahertz imaging, defect detection, YOLOv8, QCL, small object detection, deep learning
Speaker
Yijing Liu
Student Xi'an Jiaotong University

Submission Author
Yijing Liu Xi'an Jiaotong University
Xingyu Wang Xi'an Jiaotong University
Yuqing Cui Xi'an Jiaotong University
Nuoman Tian Xi'an Jiaotong University
Liuyang Zhang Xi'an Jiaotong University
Tiancheng Zhou Huazhong University of Science and Technology;Wuhan Second Ship Design and Research Institute
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Important Date
  • Conference Date

    Aug 01

    2025

    to

    Aug 04

    2025

  • Aug 20 2025

    Draft paper submission deadline

Sponsored By
中国机械工程学会设备智能运维分会
Organized By
新疆大学