Extraction of Abrasion Scratch Topography from Worn Potentiometer Resistive Film Surface using Vision-based 3D Reconstruction Coupled with Optical Microscope
ID:91 View Protection:ATTENDEE Updated Time:2025-06-26 15:56:02 Hits:328 Poster Presentation

Start Time:Pending(Asia/Shanghai)

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Abstract
The study of wear modes in conductive plastic potentiometers (CPPs) benefits from the extraction of three-dimensional (3D) topographies of abrasion scratches at various wear stages. Specialized surface topography measurement devices, such as laser interferometers, are costly for this task and require relatively clean laboratory environmental conditions, which are unsuitable for the harsh environment of wear testing areas. This limitation hampers the ease and lowers the frequency of topography measurements. To overcome these issues, this paper introduces a cost-effective vision-based 3D reconstruction method using an optical microscope. A standard optical metallographic microscope is used to capture images of the resistive film surface, and then computer vision algorithms based on aero-triangulation are utilized to reconstruct the abrasion scratch topographies. As demonstrated by the experimental results, the proposed method offers a balance between affordability and an engineering-acceptable resolution.
Keywords
Topography,Vision-based 3D reconstruction,Potentiometer resistive film,Aero-triangulation,Abrasion scratch
Speaker
Zhendan Lu
Student Beihang University

Submission Author
Zhendan Lu Beihang University
Yunxia Chen Beihang University;School of Reliability and Systems Engineering
Chen Xie Beihang University
Yawen Zhang Beihang University (Beijing University of Aeronautics and Astronautics)
Yu Zhou AECC Shenyang Engine Research Institute;Key Laboratory of Power Transmission Technology on Aero-Engine, Aero Engine Corporation of China
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Important Date
  • Conference Date

    Aug 01

    2025

    to

    Aug 04

    2025

  • Aug 20 2025

    Draft paper submission deadline

Sponsored By
中国机械工程学会设备智能运维分会
Organized By
新疆大学