2016 IEEE Advanced Information Management,Communicates,Electronic and Automation Control Conference (IMCEC)

96 / 2016-05-09 15:41:17

Proton Single Event Effects Testing of Xilinx Zynq-7010 System-on Chip

system-on chip, reliability, single event effects

System-on chip is appropriate to apply in control system and communication system in space environment. However, the reliability and safety of System-on chip based on nanotechnology is under serious threat in harsh space environment, especially single event effect caused by ionized particles in complex radiation environment. In this paper, the single event effect sensitivity of system-on chip (SoC) induced by low energy proton (< 10MeV) have been studied using Xilinx Zynq-7010 SoC, which is fabricated with 28 nanometer technology node. The proton single event effects (SEE) experiments have been performed on different components of Zynq-7010 SoC, including D-Cache, programmable logic (PL), arithmetic logical unit (ALU), float point unit (FPU) and direct memory access (DMA). The possible reasons of different cross section versus proton energy curves were analyzed. The experimental results also indicate the PL and Cache are more sensitive than other blocks under test.