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Introduction

Inverse problems arise from the need to interpret indirect measurements. Such situations are common in many application areas such as medical imaging, nondestructive testing, underground prospecting, astronomical imaging, remote sensing, image processing, and data mining. Scientific research of inverse problems is multidisciplinary and involves for example mathematics, physics, engineering and signal processing.

The Applied Inverse Problems (AIP) conference series is the premier scientific meeting of the field, organized by Inverse Problems International Association (IPIA) every two years. The upcoming conference is the ninth in the series. Previous venues have been:2015, Helsinki, Finland • 2013 Daejeon, South Korea • 2011 College Station, Texas • 2009 Vienna, Austria • 2007 Vancouver, Canada • 2005 Cirencester, United Kingdom • 2003 Lake Arrowhead, California • 2001 Montecatini, Italy.

Call for paper

Important date

2016-12-30
Abstract submission deadline
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Important Date
  • Conference Date

    May 29

    2017

    to

    Jun 02

    2017

  • Dec 30 2016

    Abstract Submission Deadline

  • Jun 02 2017

    Registration deadline

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