Introduction

ICST is 10 years old! Come join us to celebrate this important milestone for the most prestigious event in our field of Software Testing, Verification and Validation. ICST 2017 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of Software Testing, Verification and Validation. ICST 2017 will include keynote addresses by eminent scientists as well as special, regular and poster sessions. All research papers will be peer reviewed on the basis of a full length manuscript and acceptance will be based on quality, originality and relevance. Accepted research papers will be published in the conference proceedings with an IEEE catalog number and ISBN number. The proceedings will be submitted for publication in IEEE Xplore. By including poster sessions, workshops, tutorials, PhD symposium, contest on bug finding, tool demonstrations, talks, and social events, ICST 2017 promises to help ensure an environment that stimulates learning and collaboration.

Yokoso! We welcome you all to Tokyo. ICST 2017 will be held from March 13 to 17, 2017 in beautiful and impressive Tokyo, Japan. Please mark your calendars for ICST 2017 Tokyo. In 2014, Tokyo was ranked first in the "Best overall experience" category of TripAdvisor's World City Survey. The city also ranked first in the categories: Helpfulness of locals, Nightlife, Shopping, Local public transportation and Cleanliness of streets. The Michelin Guide has awarded Tokyo by far the most Michelin stars of any city in the world. Tokyo has plenty of cultural and exciting places such as museums, the sumo wrestling arena, the kabuki theater, and Akihabara town.

In Tokyo, you can find plenty of high-class and reasonably priced restaurants. If you have any problem in Tokyo, do not worry, people of Tokyo are courteous and kind. Tokyo promises you many exciting and heart-warming experiences.

Call for paper

Important date

2016-09-23
Draft paper submission deadline
2016-11-26
Draft paper acceptance notification
2017-01-23
Final paper submission deadline

Submission Topics

We invite the submission of high-quality papers in all areas of software testing, verification, and validation. Research papers should present original and significant work that advances the state of the art. Topics of interest include, but are not limited to:

  • Testing theory and practice

  • Testing in globally-distributed organizations

  • Model-based testing

  • Model-driven engineering and testing

  • Domain specific testing, such as:

    1. Mobile app testing

    2. Web-service testing

    3. Database testing

    4. Embedded software testing

    5. Testing concurrent software

    6. Testing large-scale distributed systems

    7. Testing cloud systems

    8. Testing real-time systems

    9. Testing data-intensive systems

    10. Testing in multi-core environments

  • Quality assurance

  • Model checking

  • Formal verification

  • Fuzzing

  • Inspections

  • Testing and analysis tools

  • Design for testability

  • Testing education

  • Technology transfer in testing

  • Agile/iterative/incremental testing processes

  • Testing of open source and third-party software

  • Software reliability

  • Performance and QoS testing

  • Security testing

  • Testing standards and technologies

  • Metrics and Empirical studies

  • Experience reports

Each submission will be reviewed by at least three members of the ICST Program Committee. Authors of the best papers presented at ICST 2017 will be invited to extend their work for possible inclusion in a special issue of International Journal on Software Tools for Technology Transfer, a Springer journal

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Important Date
  • Conference Date

    Mar 13

    2017

    to

    Mar 17

    2017

  • Sep 23 2016

    Draft paper submission deadline

  • Nov 26 2016

    Draft Paper Acceptance Notification

  • Jan 23 2017

    Final Paper Deadline

  • Mar 17 2017

    Registration deadline

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IEEE Computer Society