3rd International Conference on Condition Assessment Techniques in Electrical Systems (CATCON 2017) [IEEE Conference record No. 41724] is technically co-sponsored by IEEE Dielectrics and Electrical Insulation Society (DEIS), IEEE Delhi Section and DEIS Chapter of IEEE Kolkata Section and is organized by Indian Institute of Technology Ropar. It will be held during 16th to 18th, November, 2017, at Indian Institute of Technology Ropar, Rupnagar, Punjab, India.
1st Edition CATCON 2013: Held successfully at Jadavpur University, Kolkata, India during Dec. 06-08, 2013. [IEEE Conference No. 31459], technically co-sponsored by the IEEE Dielectrics and Electrical Insulation Society (DEIS) and organized by Dielectrics and Electrical Insulation Society Chapter of IEEE Kolkata Section, India. Conference Chair: Prof. Sivaji Chakravorti, Conference Secretary: Dr. Debangshu Dey.
2nd Edition CATCON 2015: Held successfully at Central Power Research Institute, Bangalore, India during Dec. 10 to 12, 2015, [IEEE Conference No. 36599], technically co-sponsored by IEEE Dielectrics and Electrical Insulation Society (DEIS) and IEEE Bangalore Section in collaboration with DEI Society Chapter of IEEE Kolkata Section, India. Conference Chair: Prof. Sivaji Chakravorti, Organizing Chair: Dr. K. Mallikarjunappa.
The intent of the conference is to provide a broad coverage and dissemination of research with emphasis on Electrical insulation, Dielectrics, Diagnostic and Prognostic studies among the audience.
CATCON 2017 will consider full papers within the scope of the conference for review. Full papers can be submitted instead of abstracts right from now onwards till June 15. However those who wish to submit abstracts are welcome to submit for early processing of visa etc (ABSTRACT SUBMISSION IS NOT MANDATORY FOR FULL PAPER SUBMISSION).
The topics include but are not limited to:
Track 1: (Condition Assessment of Electrical Equipment)
Condition monitoring of solid, liquid, gas and composite insulation in electrical equipment using time-domain and frequency-domain techniques, dielectric ageing mechanisms and their assessment, nano-dielectrics, noise and vibro-acoustic analysis, on-line and real-time condition monitoring, thermography, climate and other environment related issues. Monitoring techniques for - rotating electrical machines, power transformers, transmission lines, power cables, power electronic drives and other electrical equipment.
Track 2: (Condition Assessment of Intricate Electrical Systems)
Strategic planning and asset management, complex interconnected and interdependent systems of systems (SoS), Gas Insulated Systems (GIS), DC insulation systems, Smart Grids and Industry applications, Power Quality monitoring and assessment.
Track 3: (Condition Assessment of Bioengineering Systems)
Sensors & actuators, methods of assessment of bioengineering and bioelectric systems, experimentations and analysis of bio-medical systems, applicability in biometrics and bio- dielectrics and nano-biosystems.
Track 4: (Advanced Signal Processing Tools and Computational Algorithms in Condition Assessment)
Signal and image processing methods and algorithms, condition assessment as a classification and pattern recognition problem, artificial intelligence techniques for smart monitoring, applicability of soft computing tools, expert systems and data mining.
Accepted full papers will be published in the proceedings. The Organizers are planning to publish all accepted papers in IEEE Xplore. The conference is participatory and at least one author of each accepted paper has to register and attend. “IEEE reserves the right to exclude a submission from distribution after the conference, including exclusion from IEEE Xplore, if the submission does not meet IEEE standards for scope and/or quality.”
Nov 16
2017
Nov 18
2017
Abstract Submission Deadline
Draft paper submission deadline
Draft Paper Acceptance Notification
Final Paper Deadline
Registration deadline
2024-11-22 India Kolkata
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2021 IEEE 5th International Conference on Condition Assessment Techniques in Electrical Systems
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