Introduction
Development of standardized measurement methods, reference materials, and metrology ensure the accuracy and reliability of test results, quality consistency of manufacturing, and support all aspects of nanoscience research, R&D, and commercialization. This sub-conference provides a forum to discuss the scientific challenges, roadmap, and opportunities associated with these efforts.
Call for paper
Important date
2017-06-01
Abstract submission deadline
Submission Topics
Sub-conference topics include but not limited to:
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Traceable measurements and instrumentation;
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uncertainty assessment associated with nanoscale measurements;
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reference material;
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nanotechnology standardization;
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nanometrology.
All Comments
Important Date
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Conference Date
Aug 29
2017
toAug 31
2017
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Jun 01 2017
Abstract Submission Deadline
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Aug 31 2017
Registration deadline
Contact Information
- 曹颖
- ch******@nanoctr.cn
- 86-*********
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