Introduction

The 2017 IEEE Nuclear and Space Radiation Effects Conference will be held July 17 - 21 at the The New Orleans Marriott, New Orleans, Louisiana. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects offered on July 17, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions. Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.

Call for paper

Submission Topics

We are soliciting papers describing significant new findings in the following or related areas:

  • Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

  • Single-Event Charge Collection Phenomena and Mechanisms

  • Radiation Transport, Energy Deposition and Dosimetry

  • Ionizing Radiation Effects

  • Materials and Device Effects

  • Displacement Damage

  • Processing-Induced Radiation Effects

  • Radiation Effects on Electronic and Photonic Devices, Circuits and Systems

  • Single-Event Effects

  • MOS, Bipolar and Advanced Technologies

  • Isolation Technologies, such as SOI and SOS

  • Optoelectronic and Optical Devices and Systems

  • Methods for Hardened Design and Manufacturing

  • Modeling of Devices, Circuits and Systems

  • Cryogenic or High Temperature Effects

  • Novel Device Structures, such as MEMs and Nanotechnologies 

  • Techniques for Hardening Circuits and Systems

  • Space, Atmospheric, and Terrestrial Radiation Effects 

  • Characterization and Modeling of Radiation Environments

  • Space Weather Events and Effects

  • Spacecraft Charging

  • Predicting and Verifying Soft Error Rates (SER) 

  • Hardness Assurance Technology and Testing

  • New Testing Techniques, Guidelines and Hardness Assurance Methodology

  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods

  • Dosimetry

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Important Date
  • Conference Date

    Jul 17

    2017

    to

    Jul 21

    2017

Contact Information
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