Description

You are cordially invited to attend the 2019 IEEE Nuclear and Space Radiation Effects Conference to be held July 8-12, 2019 at the Marriott Rivercenter Hotel, in San Antonio, Texas. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short course on a radiation effects issue with current relevance offered on July 8, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.

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Important Dates

Draft paper submission deadline:2021-02-05

Call for paper description

Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.

Topics of submission

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

  • Single-Event Charge Collection Phenomena and Mechanisms
  • Radiation Transport, Energy Deposition and Dosimetry
  • Ionizing Radiation Effects
  • Materials and Device Effects
  • Displacement Damage
  • Processing-Induced Radiation Effects

 Radiation Effects on Electronic and Photonic Devices, Circuits and Systems

  • Single Event Effects
  • MOS, Bipolar and Advanced Technologies
  • Systems on Chip, GPUs, FPGAs, Microprocessors
  • Isolation Technologies, such as SOI and SOS
  • Methods for Hardened Design and Manufacturing
  • Modeling of Devices, Circuits and Systems
  • Cryogenic or High Temperature Effects
  • Novel Device Structures, such as MEMs and Nanotechnologies
  • Techniques for Hardening Circuits and Systems

 Space, Atmospheric, and Terrestrial Radiation Effects 

  • Characterization and Modeling of Radiation Environments
  • Space Weather Events and Effects
  • Spacecraft Charging
  • Predicting and Verifying Soft Error Rates (SER)

 Hardness Assurance Technology and Testing

  • New Testing Techniques, Guidelines and Hardness Assurance Methodology
  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods
  • Dosimetry

 New Developments of Interest to the Radiation Effects Community

 

 

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Contact information

  • steven.mcclure@jpl.nasa.gov

Sponsored By

  • IEEE

Supported By

  • IEEE Nuclear and Plasma Sciences Society