The International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA symposium), first held in 1983, held once every two years, gathers experts from all over the world and has always been fruitful and productive. Every year, scientists and engineers discuss and present the state-of-the-art technology R&D and macro development of the industry’s future. It is considered the most important event in Taiwan’s semiconductor industry and highly anticipated by local companies. Taking advantage of the information learned during the conference, the symposium hopes to create new opportunities for Taiwan’s semiconductor industry. The VLSI-TSA symposium is becoming more significant since Taiwan not only occupies a prominent position in the global semiconductor industry, but also is increasingly competitive globally in IC design technology and communications information products. 
The International Symposium on VLSI Design, Automation & Test (VLSI-DAT symposium ) was spun-off in 2005 from the International Symposium on VLSI-TSA. The VLSI-DAT symposium is proud to create a platform for technical exchanges and communications shared by experts from all over the world. The purpose is to bring together scientists and engineers actively engaged in research, development, and manufacturing on VLSI Design, Automation and Test to discuss current progress in this field. 
  Retrospect - from 1983 to 2003
   • International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
   • Initiated by Industrial Technology Research Institute in 1983, technical sponsored by IEEE.
   • Focus mainly on VLSI Technologies, Circuits and Applications.
   • Being held biannually.
   • 100-200 papers were submitted every two years, totally over 1500 papers were submitted between
   • More than 6000 attendees were attracted between 1983-2003. 
  Evolution - starting 2005
   • Starting 2005, the conference was divided into two consecutive conferences:
    ÜInternational Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)
     > Focusing on process and advanced technology.
     > With oral presentations and short courses.
    ÜInternational Symposium on VLSI Design, Automation, and Testing (VLSI-DAT)
     > Focusing on design, design automation, and testing.
     > With oral presentations, poster presentations, and tutorials.
   • The two conferences are held annually in the last week of April with one-day overlap.
   • Between 2005-2007, 240 papers were submitted to VLSI-TSA, average acceptance rate 55%;525 papers
     were submitted to VLSI-DAT, average acceptance rate 39%.
   • More than 3500 attendees in the past 4 years ( 2006~2009 ) for the 2 conferences.
  Recent VLSI-TSA and DAT symposia - from 2013 to 2018
   • The two conferences are held annually in the last week of April with three-days overlap from 2013 to 2016 and 
      four-days from 2017.
   • Between 2013-2018, about 670 papers were submitted to VLSI-DAT, average acceptance rate 46%.
   • More than 4500 attendees attended the VLSI-TSA and DAT symposia.


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2017-10-22 星期日

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2017-10-25 星期三

Call for paper


We appreciate your interest in submitting a paper to the 2019 International Symposium on VLSI Design, Automation, and Test (2019 VLSI-DAT). Herewith forms and information are provided for your preparation of paper submission.

Author guidelines

• Prospective authors must submit a self-contained paper with figures and tables electronically through the conference website by Oct.31, 2018  (23:59 GMT+8) 

 The length of a submitted paper must be 2-4 pages. Any submissions not adhering to the length constraint will be returned immediately without review.

• In addition to the paper and camera-ready manuscript, the submission should be included with a 80~100 Word ABSTRACT, which will be published in the advance and final program if the paper is accepted.

• VLSI-DAT adopts the DOUBLE BLIND REVIEW process; please DO NOT reveal your name(s) or affiliation(s) anywhere in the submitted manuscript for the first paper submission.

• Before submitting your abstract/paper, please review the information on IEEE Intellectual Property Rights at

• The notices of acceptance will be sent out to authors on December 28, 2018.

• Any changes on title and author list or withdraw after acceptance must be approved by Technical Program Co-Chairs.

• For an accepted paper to be published in the proceedings, one of its co-author(s) MUST pay the full registration fee by February 28, 2019 23:59 (GMT+8) and attend the symposium to present the paper. Note that each accepted paper shall be accompanied by a different full registration; that is, two full registrations are required for presenting two papers even if the presenter is the same.

• Presentation of accepted papers at the symposium must be in English and will be limited to 18 minutes with an additional 2 minutes for Q&A. The final manuscript of all accepted papers will be published as submitted in the proceedings.

• No-show papers will not be included in the symposium proceedings and will not be submitted to the IEEE Xplore database.

Student Subsidy 
• All students are entitled to get a discount of up to 85% on the registration fee.
• Financial supports are available for full-time student presenters living outside of Taiwan.
Special Session Submission
To encourage industry and research institutes to share their experiences on system and product development, 1 or 2-page papers on system prototyping and product development are solicited. Submission to this special session should specifically select the paper category of System Prototyping / Product Development to be reviewed separately from the regular submissions.
 Best Paper Award 

Two best papers will be selected this year through a rigorous evaluation process, which is conducted by the program committee and session chairs.

Topics of submission

Original, unpublished papers on all aspects of VLSI Design, Automation and Test are solicited, including but not limited to:

RF, Analog and Mixed Signal Circuits Digital Circuits and ASICs Logic and Behavioral Synthesis Test Generation and Compression
Sensors and Interface Circuits CPU, DSP and Multicore Architectures Physical Design and Verification Design-for-Testabilityand BIST
Memory Circuits and Systems Multimedia Processing Designs Design for Manufacturability RF, Analog and Mixed-Signal Test
Biomedical Circuits Communication Designs Power/Thermal Estimation and Optimization Memory Test
Energy-Harvesting and Power Circuits Hardware Security and Trust Design Verification SOC and System Level Test
Ultra Low-Power Circuits and Systems Designs for Edge Computing Modeling and Simulation Silicon Debug and Diagnosis
Memristive and Neuromorphic Circuits Designs for Machine Learning Electronic System Level Design 3D IC and Interposer-Based IC Test
Security Circuits for IoT and AI SOC and NOC Architectures Hardware/Software Co-Design Yield and Reliability Enhancement
  Embedded System and Software Machine Learning for EDA On-Chip Monitoring
  System-in-Package Designs Analog EDA Test Data Mining and Learning
    EDA for Microfluidic Biochips Test Standards


• Tim Cheng, Hong Kong University of Science and Technology (HKUST), Hong Kong

• Tzi-Cker Chiueh, Industrial Technology Research Institute, Taiwan

• Tzi-Dar Chiueh, National Taiwan University, Taiwan

• Jiun-In Guo, National Chiao Tung University, Taiwan

• Shye-Jye Jou, National Chiao Tung University, Taiwan

• Kuen-Jong Lee, National Cheng Kung University, Taiwan

• Donald Y.C. Lie, Texas Tech. University, USA

• Youn-Long Lin, National Tsing Hua University, Taiwan

• Jyuo-Min Shyu, National Tsing Hua University, Taiwan

• Li-C. Wang, University of California Santa Barbara, USA

• Cheng-Wen Wu, National Tsing Hua University, Taiwan



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Important dates

  • Conference Dates

    22 Apr.



    25 Apr.


  • 31 Oct.


    Draft paper submission deadline

  • 28 Dec.


    Draft paper acceptance notification

  • 28 Feb.


    Final paper deadline

Contact information