The 4th International Conference on Radiation Effects of Electronic Devices (ICREED-2021) will be held during 26th-29th May 2021, Xi’an, China.
The conference features a series of invited talks, contributed talks, several technical sessions including poster session, and industrial exhibits, giving recent achievements in nuclear and space radiation effects on electronic and photonic materials,devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits. The conference will provide a communication platform for scientists, scholars, engineers, project managers and students in radiation effectsand related fields, from all over the world. International participation is strongly encouraged.
We are soliciting papers describing significant new findings in the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
Single-Event Charge Collection Phenomena and Mechanisms
Radiation Transport, Energy Deposition and Dosimetry
Lonizing Radiation Effects
Materials and Device Effects
Displacement Damage
Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices and Circuits
MOS, Bipolar and Advanced Technologies
Isolation Technologies, such as SOI and SOS
Optoelectronic and Optical Devices and Systems
Modeling of Devices, Circuits and Systems
Novel Device Structures, such as MEMS and Nanotechnologies
Spaceand Terrestrial Radiation Effects
Characterization and Modeling of Radiation Environments
Predicting and Verifying Soft Error Rates (SER)
Hardness Assurance Technology and Testing
Testing Techniques, Guidelines and Hardness Assurance Methodology
Hardness Assurance at System Level
Unique Radiation Exposure Facilities or Novel Instrumentation Methods
Dosimetry
EmergingConcepts for Space Systems
Emerging technologies
Alternative concepts for Radiation Hardness
May 26
2021
May 29
2021
Draft paper submission deadline
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