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Challenges and case-studies in ensuring automotive quality on nanoscale SOCs
ID：13 View Protection：ATTENDEE Updated Time：2021-08-14 15:27:25 Hits：611 Oral Presentation

Start Time：2021-08-19 22:10（Asia/Shanghai）

Duration：20min

Session：IS Industrial Session » IS2B3. Automotive Test and Reliability

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Speaker
David Francis
Texas Instruments, USA

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Important Date

  • Conference Date

    Aug 18

    2021

    to

    Aug 20

    2021

  • May 10 2021

    Draft paper submission deadline

  • Aug 16 2021

    Early Bird Registration

  • Aug 19 2021

    Contribution Submission Deadline

  • Aug 20 2021

    Registration deadline

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IEEE
Tongji University
Chinese Computer Federation
Organized By
Tongji University
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