2021 IEEE International Test Conference in Asia (ITC-Asia 2021)

Aibin Yan

Dr. Aibin Yan is an IEEE/CCF Senior Member, a PhD supervisor and an Associate Professor with School of Computer Science and Technology, Anhui University (AHU), China. He received a Ph.D degree in Computer Application Technology from Hefei University of Technology, China, and a M.S. degree in Software Engineering from the University of Science and Technology of China (USTC), Hefei, in 2015 and 2009, respectively. He joined Anhui University, Hefei, in 2016. During 2018.9-2019.9, he visited the WEN Lab, Kyushu Institute of Technology, Japan, under the support of China Scholarship Council (CSC), and under the supervision of Prof. Xiaoqing WEN, an IEEE Fellow, for a full year of time. During that year, he participated in chip design, tape out and test. On July 2021, he created the AHU Institute of Chip Design and Test serving as a director. In recent years, he served as a Session Chair of 52nd IEEE International Symposium on Circuits and Systems, Publicity Chair and TPC Member of 27th IEEE Asian Test Symposium. His research interests mainly include radiation hardening by design for nano-scale CMOS ICs such as latches, flip-flops, and memory cells. Details can be found through his website: http://ca.hfut.edu.cn/xyz/