2021 IEEE International Test Conference in Asia (ITC-Asia 2021)

Charles H.-P. Wen

Prof. Hung-Pin (Charles) Wen received the Ph.D. degree in very large-scale integration (VLSI) verification and test from the University of California at Santa Barbara, Santa Barbara, CA, USA, in 2007. He is currently a Distinguished Professor (2020-now) with National Yang Ming Chiao Tung University, Hsinchu, Taiwan, where he is also a specialist in computer engineering. Over the past few years, his research has been focused on applying machine learning and data mining to system-on-chip designs (including radiation hardening, functional verification, and timing analysis) and cloud networking (especially on performance analysis and architecture design of large-scale data centers). Prof. Wen was a recipient of the Best Paper Awards from the 2012 Asia and South Pacific Design Automation Conference (ASP-DAC), the 2014 Synthesis And System Integration of Mixed Information (SASIMI), the 2016 International Conference on Information Networking (ICOIN), the 2017 ICOIN, and the Distinguished Young Scholar Award of the Taiwan IC Design Society.