About Components, Circuits, Devices and Systems
Keywords:Design for testability,Circuit testing,Automatic Test Equipment,Design and test for Computers,Built-in Self-Test,Semiconductor Device Testing,
Scope:The Premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems, the aim of this conference is to provide an international forum for these experts to promote, share, and discuss various issues and developments in the growing filed of VLSI Test.
Sponsor Type:1; 3

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Important Date
  • Conference Date

    Apr 23



    Apr 26


Sponsored By
IEEE Computer Society Philadelphia Section
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