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Testability design of spacecraft test equipment based on BIT
ID：51 View Protection：PUBLIC Updated Time：2022-12-20 21:17:24 Hits：1053 Poster Presentation

Start Time：Pending（Asia/Shanghai）

Duration：Pending

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Abstract
In this paper, the requirements of power supply and distribution, measurement and control, control and propulsion and other front-end special equipment in the integrated test system of deep space spacecrafts are analyzed, and the testability design method of built-in-test (BIT) of the equipment is studied. It mainly includes the testability design of the key circuit of the board and the device port signal between board and device. Carry out various design of BIT models of analog input / output and digital input / output signals to realize non-destructive or low-loss real-time monitoring of signals. This paper designs a verification environment for BIT function application, and verifies the correctness of BIT design for standard mode and failure mode. It provides a technical method for real-time health diagnosis and failure warning of space equipment in unattended condition.The technology achievement  has been applied in the ground integrated test system of Chang'e-6 probe.
 
Keywords
Speaker
Zhao Yang
Beijing Institute of Spacecraft System Engineering

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Important Date

  • Conference Date

    Nov 30

    2022

    to

    Dec 02

    2022

  • Nov 30 2022

    Draft paper submission deadline

  • Dec 24 2022

    Contribution Submission Deadline

  • Apr 13 2023

    Registration deadline

Sponsored By
Harbin Insititute of Technology
China Instrument and Control Society
Heilongjiang Instrument and Control Society
Chinese Institute of Electronics
IEEE I&M Society Harbin Chapter
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