The IEEE NSS-MIC-RTSD is a unique meeting in the field of radiation detectors and instrumentation, with a broad range of applications, fields of study and experiences of the attendees and presenters ? academics, engineers, medical physicists, and physicians. The synergy created by the joining of the NSS, MIC and RTSD offers a networking potential to boost your scientific creativity, to exchange ideas, share and create knowledge in the radiation detector and electronics technology, nuclear science, medical imaging, environmental monitoring and space exploration fields.
Oct 30
2027
Nov 06
2027
Registration deadline
2015-10-31 United States
The 22nd International Conference on Room-Temperature Semiconductor Detectors (RTSD)
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