RF Loopback SNR Estimation via Adaptive LOESS and Whittle-Likelihood Leakage Deconvolution
ID:12 View Protection:ATTENDEE Updated Time:2026-09-11 21:44:17 Hits:15 Poster Presentation

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Abstract
Signal-to-noise ratio (SNR) estimation in radio frequency (RF) loopback testing is biased by the composite colored noise whose PSD straddles the inverse-square-frequency and inverse-frequency regions, and is further complicated by the coherent reference-clock phase noise and the fractional-bin spectral leakage. We adopt the in-band SNR definition, namely the signal power divided by the noise power within the signal band, since out-of-band noise is removed by the receiver filter and does not compete with the signal, and propose three complementary components on the Welch PSD: (1) a curvature-adaptive robust LOESS envelope that preserves sharp in-band spectral features; (2) a leakage-kernel deconvolution that recovers the signal power from the fractional-bin leakage; and (3) a Whittle-likelihood multi-frequency estimator that jointly fits an inverse-square-frequency plus inverse-frequency plus white-noise model across K carriers with K-fold variance reduction. The deconvolution and the Whittle fit are solved jointly by alternating a projected Landweber update with a frequency-dependent noise-model fit, which keeps the estimate unbiased down to SNR = −20 dB where the scalar-noise-floor baselines fail. As shown in the simulations over three experiments, the adaptive LOESS keeps the mean error within ±0.2 dB across the −10 to 30 dB SNR range, the Whittle estimator within [−0.14, −0.08] dB, and the adaptive window delivers a 3 to 11 dB SNR accuracy gain over the fixed-span baseline in the in-band spur scenario, where the joint estimator is biased by about 3 dB and the conventional full-band average fails.
Keywords
Adaptive-window LOESS, coherence modeling, iterative deconvolution, RF loopback, SNR estimation.
Speaker
chenliang gu
Engineer The 10th Research Institute of China Electronics Technology Group Corporation

Submission Author
Chenliang Gu The 10th Research Institute of China Electronics Technology Group Corporation
Ziheng Zhang The 10th Research Institute of China Electronics Technology Group Corporation
Chengwenyuan Huang The 10th Research Institute of China Electronics Technology Group Corporation
Ruinian Yao The 10th Research Institute of China Electronics Technology Group Corporation
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Important Date
  • Conference Date

    Nov 06

    2026

    to

    Nov 08

    2026

  • Oct 15 2026

    Draft paper submission deadline

Sponsored By
IEEE Instrumentation and Measurement Society
Organized By
Sichuan University