Researchon Deep Learning Soft Sensor Optimization Method Based on Mutual Information Optimized Just-in-Time Fine-Tuning
ID:95 View Protection:ATTENDEE Updated Time:2026-09-24 21:46:38 Hits:1 Poster Presentation

Start Time:Pending(Asia/Shanghai)

Duration:Pending

Session:No Session »

No files

Abstract
Deep learning soft sensor technology plays an important role in industrial process monitoring, but data distribution shifts caused by concept drift severely affect the predictive performance and generalization ability of models. Most existing methods adopt global static one-time modeling, which struggles to track dynamic changes in online operating conditions, or use online local modeling that is difficult to fit high-dimensional and strongly coupled complex industrial data. To address this issue, this paper proposes an online adaptive updating method for deep learning soft sensors based on Mutual Information Optimized Just-in-Time Fine-Tuning (MI-JITFT). First, a feature selection and weighting strategy based on mutual information optimization is designed to eliminate redundant noise and enhance the effectiveness of similar data retrieval by quantifying the importance of auxiliary variables. Then, just-in-time learning is combined with deep learning to dynamically fine-tune the deep learning soft sensor model by retrieving similar historical samples in real-time, thereby overcoming the degradation of predictive performance caused by concept drift. Experimental results on the penicillin fermentation process dataset demonstrate that the proposed method can effectively improve the working condition adaptive capability of various deep learning models.
Keywords
Soft sensor, Concept drift, Online update, Just-in-time learning, Mutual information
Speaker
XU SHENGRAN
Dr 北京信息科技大学

Submission Author
XU SHENGRAN 北京信息科技大学
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Nov 06

    2026

    to

    Nov 08

    2026

  • Oct 15 2026

    Draft paper submission deadline

Sponsored By
IEEE Instrumentation and Measurement Society
Organized By
Sichuan University