We are pleased to announce that IEEE Sarnoff Symposium 2016 will be held at New Jersey Institute of Technology (NJIT), September 19-21, 2016. The advent of Software Defined Networking (SDN) and Network Function Virtualization (NFV) has introduced a paradigm shift in telecom and networking. Internet of Everything (IoE) with concomitant advances in Wireless, Wireline and Data Center network technologies have fostered ubiquitous network connectivity. The entire networking and telecom ecosystem comprising of Original Equipment Manufacturers (OEMs), Silicon Providers, Independent Software Vendors (ISVs), System Integrators and Service Providers has been impacted by this change. Information and Communication Technologies (ICT) are intersecting in unique ways to provide value added services to various vertical industries such as Energy and Utilities, Healthcare, Transportation, Retail, Media and Entertainment, Finance and Public Safety.
While keeping the focus on research in core network technologies from academia and inviting submissions from ecosystem stakeholders, IEEE Sarnoff Symposium 2016 will also provide the platform to cover the perspectives of vertical industries. Keeping this in mind, our Call for Papers encompasses a wide variety of topics covering theory, application and practice and has a broad appeal for researchers and practitioners alike.
Through a series of keynote talks, invited talks, technical paper presentations, panel sessions, tutorial sessions, industry exhibits and poster sessions, IEEE Sarnoff Symposium will bring together leading researchers and practitioners in academia and industry to deliberate, discuss and share findings on leading edge research, implementation experiences and challenges.
The Symposium is soliciting state-of-the-art research papers, panels and tutorial proposals including, but not limited to, the following topics:
Sep 19
2016
Sep 21
2016
Final Paper Deadline
Registration deadline
2018-09-24 United States
2018 IEEE 39th Sarnoff Symposium2017-09-18 United States Newark
2017 IEEE 38th Sarnoff Symposium
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