Introduction
The International Design and Test Symposium is an IEEE technically co-sponsored event devoted to exploring emerging challenges and new concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability held in the Middle East and Africa (MEA) region. The Symposium is initiating in affiliation with the IEEE TTTC (Test Technology Technical Council) and the 2016 edition is organized and sponsored by CES Laboratory and the University of Sfax. It is also technically co-sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English.
Call for paper
Important date
Submission Topics
Topics of interest include but are not limited to:
-
Design Methods and Tools
-
Test and Reliability
-
IP and SOC Design
-
Multiprocessor/Multi-core Systems
-
Embedded Systems
-
DFX
-
Analog, Mixed Signal and RF Design
-
High Speed Circuits Design
-
Design of MEMS and MOEMS
-
Low Voltage and Low Power system
-
Innovative Technologies
-
IoT design
-
Simulation, Validation & Verification
-
System Specification and Modeling
-
Formal Methods and Verification
-
System Design/Synthesis/Optimization
-
Yield Optimization
-
IP and SOC Testing
-
Multiprocessor/Multi-Core Systems Test
-
Memory & FPGA Test & Repair
-
Automotive reliability & test
-
High Speed, Analog, Mixed Signal & RF Testing
-
MEMS/MOEMS Testing
-
Defect and Fault Modeling
-
DFT, BIST and BISR
-
On-line Testing / Fault Tolerance
-
Fault Simulation, ATPG
-
Reliability Failures/ Modeling
-
Circuit Reliability
-
Electronic System Reliability
All Comments
Important Date
-
Conference Date
Dec 18
2016
toDec 20
2016
-
Nov 03 2016
Draft paper submission deadline
-
Dec 20 2016
Registration deadline
Contact Information
Submit Comment