The “International Forum on Surface and Microscopy, 2017” (IFSM 2017) symposium is the second special conference for optical microscopic imaging in China, bringing together professionals engaged in optical microscopy to make academic exchanges, and providing a platform for scientific researchers to present prospective viewpoint and probe into key technologies. The themes of the conference include not only the wide range of fields for optical microscopy research and applications, such as nanoscopy technology, hyperspectral imaging, nonlinear excitation microscopy imaging, fluorescence correlation spectroscopy, optical coherence tomography, confocal microscopy, white light interfering microscopy, dark field microscopy imaging, difference imaging, phase contrast microscopy, multi-photon microscopy, super-resolution imaging technology and etc., as well as include research and application progress of surface science and engineering that closely related to microscopic instruments, such as theoretical studies on the surface and interface of materials in the field of materials science and micromachining, research of failure mechanism on the surface and interface of materials, abrasion and corrosion behavior, analysis of failure mechanism on materials surface, geometric parameters measurement, application in life science research area, clinical diagnosis and etc.

Call for paper

Important Dates

Draft paper submission deadline:2017-08-15

Abstract submission deadline:2017-06-10

Topics of submission

Topics1: Optical stereo imaging and applications

  • Optical confocal microscopy

  • White light scanning microscopy

  • Interfering microscopy

  • Structured illumination imaging

  • Dark field optical microscopy

  • Near field optical microscopy

  • Spectroscopy

  • X-ray tomography

Topics2: Metrology & standardization

  • Surface, micro/ nano-metrology

  • Micro/nano- measurement and instrumentation

  • Calibration methods and artifacts

  • AFM/SPM metrology

  • Stylus instruments and metrology

  • In-process/In-line measurement

Topics3: Super-resolution imaging and diffraction optics theory and application

  • Optical pupil filtering and wavefront engineering

  • Nanophotonics

  • Nonlinear and ultrafast optics

  • Holography

  • Diffractive grating

Topics4: Biomedical optical imaging methods and applications

  • Optical coherence tomography

  • Raman Spectroscopy

  • Optical projection tomography

  • Bioluminescence imaging

  • Fluorescence imaging

  • Cerenkov luminescence imaging

  • Photoacoustic tomography

  • Diffuse optical imaging

  • Multimodality imaging

Topics5: Nano/Biophotonics materials

  • Reporters, dyes and molecular probes for biomedical applications

  • Nanophotonics imaging for biomedical application

  • Quantum dots for biomedical applications

  • Up/down-conversion luminescence material for biomedical applications

Topics6: Biomedical optical microscopy systems and applications

  • light-sheet microscopy, selective plane illumination microscope

  • Imaging and analysis of biomolecules, cells, and tissues

  • Two/multi-photon microscopy

  • Three-dimensional and multidimensional microscopy

  • Single molecule spectroscopy and superresolution imaging


Honorary Chairs:
Guofan Jin (Tsinghua University)
Liwei Zhou (Beijing Institute of Technology)
Jianquan Yao (Tianjin University)
General Chairs:
Songlin Zhuang (Shanghai Polytechnic University)
TonyWilson (University of Oxford)
Jiubin Tan (Harbin Institute of Technology)
Program Committee:
Jian Liu (Harbin Institute of Technology)
Guanhao Wu (Tsinghua University)
Liandong Yu (Hefei University of Technology)
Peng Xi (Peking University)
Sijin Wu (Beijing Information Science and Technology University)
Tong Guo (Tianjin University)
Wei Liu (Dalian University of Technology)
Xiaodong Hu (Tianjin University)
Xin Chen (Shanghai Jiaotong University)
Yanlong Cao (Zhejiang University)


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    Contact information

    • 蔡方方

    Sponsored By

    • China Optical Engineering Society
      China Instrument Society
      Harbin Institute of Technology

    Organized By

    • China Metrology and testing institute metrology instrument Specialized Committee
      China Institute of Astronautics