Welcome to the Fifteenth Annual IEEE Workshop on Microelectronics and Electron Devices (WMED 2017). WMED 2017 is a technical forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization and reliability, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or work-in-progress.
Microelectronic Device Processing and Process Integration
Trends in Submicron CMOS technology, Product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (Phase Change Memory, Resistive Memory, Ferroelectric Memory), Novel transistors
Nanoelectronic Devices and MEMS
Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research
Microelectronic Device Electrical and Reliability Testing
Dielectric reliability, Device reliability, Novel memory technology testing schemes
Semiconductor Packaging and Reliability
Semiconductor package reliability, Design for Manufacturability, Stacked die packaging and Novel assembly processes
Microelectronic Circuit Design
New product design, high-speed and/or low-power design techniques and architectures and memory sensing schemes
Apr 21
2017
Conference Date
Draft paper submission deadline
Registration deadline
2018-04-20 United States
2018 IEEE Workshop on Microelectronics and Electron Devices2016-04-15 United States Boise, ID, USA
2016 IEEE Workshop on Microelectronics and Electron Devices2015-03-20 United States
2015 IEEE Workshop on Microelectronics and Electron Devices2014-04-18 United States
2014 IEEE Workshop On Microelectronics And Electron Devices2013-04-12 United States
2013 IEEE Workshop on Microelectronics and Electron Devices
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