Introduction

Welcome to the Fifteenth Annual IEEE Workshop on Microelectronics and Electron Devices (WMED 2017). WMED 2017 is a technical forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization and reliability, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or work-in-progress.

Call for paper

Important date

2017-01-27
Draft paper submission deadline

Submission Topics

  • Microelectronic Device Processing and Process Integration

  • Trends in Submicron CMOS technology, Product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (Phase Change Memory, Resistive Memory, Ferroelectric Memory), Novel transistors

  • Nanoelectronic Devices and MEMS

  • Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research

  • Microelectronic Device Electrical and Reliability Testing

  • Dielectric reliability, Device reliability, Novel memory technology testing schemes

  • Semiconductor Packaging and Reliability

  • Semiconductor package reliability, Design for Manufacturability, Stacked die packaging and Novel assembly processes

  • Microelectronic Circuit Design

  • New product design, high-speed and/or low-power design techniques and architectures and memory sensing schemes

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Important Date

  • Apr 21

    2017

    Conference Date

  • Jan 27 2017

    Draft paper submission deadline

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