2018 IEEE 27th North Atlantic Test Workshop (NATW)

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. In addition to traditional topics, the 27th NATW will feature a general theme of "Sillicon Photonics." Topics are not limited to, the following: Analog, Mixed Signal and RF Testing, Built-In Self-Test (BIST), Board Level Testing, Delay and Performance Testing, Design Verification/Validation, Diagnosis and Debug, Fault Modeling/Simulation, FPGA and Embedded Core Testing, IDDQ Testing, DFM, Defect Analysis and Defect-Based Testing, Memory and MEMS Testing, Nanotechnology Testing, Online Testing, System-on-Chip (SoC) Test and Debug/Test Quality and System Reliability.