Description

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. In addition to traditional topics, the 27th NATW will feature a general theme of "Sillicon Photonics." Topics are not limited to, the following: Analog, Mixed Signal and RF Testing, Built-In Self-Test (BIST), Board Level Testing, Delay and Performance Testing, Design Verification/Validation, Diagnosis and Debug, Fault Modeling/Simulation, FPGA and Embedded Core Testing, IDDQ Testing, DFM, Defect Analysis and Defect-Based Testing, Memory and MEMS Testing, Nanotechnology Testing, Online Testing, System-on-Chip (SoC) Test and Debug/Test Quality and System Reliability.

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Important dates

  • Conference Dates

    07 May.

    2018

    TO

    09 May.

    2018

  • 02 Mar.

    2018

    Abstract submission deadline

  • 02 Mar.

    2018

    Draft paper submission deadline

  • 06 Apr.

    2018

    Draft paper acceptance notification

  • 25 Apr.

    2018

    Final paper deadline

Contact information

  • Ted Cooley
  • escooley03@gmail.com

Sponsored By

  • IEEE

Conference Series