Introduction

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. In addition to traditional topics, the 27th NATW will feature a general theme of "Sillicon Photonics." Topics are not limited to, the following: Analog, Mixed Signal and RF Testing, Built-In Self-Test (BIST), Board Level Testing, Delay and Performance Testing, Design Verification/Validation, Diagnosis and Debug, Fault Modeling/Simulation, FPGA and Embedded Core Testing, IDDQ Testing, DFM, Defect Analysis and Defect-Based Testing, Memory and MEMS Testing, Nanotechnology Testing, Online Testing, System-on-Chip (SoC) Test and Debug/Test Quality and System Reliability.

Call for paper

Important date

2018-03-02
Abstract submission deadline
2018-03-02
Draft paper submission deadline
2018-04-06
Draft paper acceptance notification
2018-04-25
Final paper submission deadline
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Important Date
  • Conference Date

    May 07

    2018

    to

    May 09

    2018

  • Mar 02 2018

    Abstract Submission Deadline

  • Mar 02 2018

    Draft paper submission deadline

  • Apr 06 2018

    Draft Paper Acceptance Notification

  • Apr 25 2018

    Final Paper Deadline

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