The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 22nd NATW will feature a half day tutorial on Wednesday titled “VLSI Test and Security.” The program includes a keynote by Brian Gaucher (IBM) on Smart Power Grids and an invited address by Stephen Sunter (Mentor Graphics) on Analog/Mixed-signal Test. In addition to traditional topics, the 22nd NATW will feature a general theme of “Growing importance of Test and Hardware Security.”

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Submission Topics

Topics are not limited to, the following: Analog, Mixed Signal & RF Testing Built-In Self-Test (BIST) Board Level Testing Delay & Performance Testing Design Verification/Validation Diagnosis and Debug Fault Modeling/Simulation FPGA & Embedded
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Important Date
  • Conference Date

    May 08



    May 10


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IEEE Boston Section Green Mountain Section
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