The ARFTG Experience
The most important part of the ARFTG experience is the opportunity to interact one-on-one with colleagues, experts and vendors of the RF and microwave test and measurement community. Whether your interests include high-throughput production or one-of-a-kind metrology measurements, complex systems or simple circuit modeling, small signal S-parameter or large-signal non-linear measurements, phase noise or noise figure, DC or lightwave, you will find a kindred spirit or maybe even an expert.
There is always ample opportunity at every ARFTG conference for detailed technical discussions with others facing similar test and measurement challenges. The members of ARFTG often find that these interactions are their best source of ideas and information for their current projects. So come and join us at our next conference. You’ll find that the atmosphere is informal and friendly.
ARFTG was founded in 1972 to create a more cohesive voice for the RF and microwave test and measurement community to solicit support from the manufacturers of test instrumentation. In the early years, the primary focus was on instrumentation automation and calibration. Soon, however, issues such as measurement metrology, connector repeatability, noise, power measurements and CAD became common topics at every ARFTG conference.
The interests of ARFTG have continued to expand with the interests of the RF and microwave test and measurement community and now include such diverse topics as: nonlinear measurements, production testing, temporal measurements, high frequency fixturing, four and six port network analysis and load pull measurements. Indeed, the broad range of ARFTG interests is reflected in the diverse nature of our recent conferences.
For the last 25 years, ARFTG has been at the leading edge for the development of new RF and microwave test and measurement techniques. In 1987 ARFTG became affiliated with the IEEE Microwave Theory and Techniques Society (MTT-S) and in 2001 became incorporated as a not-for-profit corporation.
ARFTG Microwave Measurement Conference
ARFTG sponsors two conferences each year. The Spring Conference is a single-day conference cosponsored with MTT-S held in June on the Friday following the IEEE International Microwave Symposium (IMS). The Fall Conference is a two-day conference on Thursday and Friday in late November or early December, one week after the Thanksgiving holiday. Conferences are conducted in a single-track workshop style with papers on topical subjects used to stimulate further discussion and interaction. Both user and manufacturer papers are solicited and a formal digest consisting of all of the conference papers is published.
ARFTG/NIST Measurement Short Course
This popular two-day course is offered by ARFTG in cooperation with National Institute of Standards and Technology (NIST). This course is taught in a seminar style and provides both an excellent grounding in the fundamentals as well as exposure to the latest in RF and microwave test and measurement techniques taught by the experts.
Basic measurements are covered on Day 1, including: a microwave measurement overview, circuit theory, vector network analysis, test fixtures, on-wafer measurements, power, and noise. Additional in-depth topics are covered on Day 2, including: phase noise, load-pull, digital modulation, and time domain techniques. Several tutorials specifically related to the conference theme are also covered on Day 2. This course is not only for young engineers just starting out but also for experienced engineers who want to broaden their expertise.
The fellowship provides financial assistance to graduate students who show promise and interest in pursuing research related to the improvement of RF and microwave measurement techniques. Once each year a $7500 award may be granted to a deserving candidate.
- ARFTG/NIST Measurements Short Course (1 ½ day): Sun, Jan 20th – Mon, Jan 21st
- ARFTG Conference (1 ½ day): Mon, Jan 21st – Tues, Jan 22nd
- RWW/ARFTG Exhibit (1 ½ day): Mon, Jan 21st – Tues, Jan 22nd
- ARFTG Workshop: High frequency and high bandwidth measurements for 5G and related applications (½ day): Wed, Jan 23rd
- RWW/ARFTG Evening Reception: Mon, Jan 21st
- ARFTG Awards Lunch: Tues, Jan 22nd
Call for paper
Draft paper submission deadline：2019-02-22
Paper submission for TPC review
- In order for your paper to be considered for inclusion in an ARFTG Conference, you must electronically submit an Abstract and paper Summary as described below by the publicized deadline.
- SUMMARY: A 1000 word minimum summary with supporting illustrations must follow the Abstract. The Summary should explain the contribution and provide sufficient technical content and details to enable proper evaluation (see Criteria for Evaluation below). Many authors submit their paper rather than a summary.
- ELECTRONIC SUBMISSION: The Abstract/Summary and related figures and tables must be submitted to the submission website and should include:
- An Abstract (which should be submitted in the space provided on the interactive page and appear at the top of the summary)
- Summary with figures, illustrations, and tables. The Summary should explain the contribution and provide sufficient technical content and details to enable proper evaluation (see Criteria for Evaluation below). PDF is the required file format. The maximum file size is 2 MB. Use the ARFTG template (see TEMPLATE below) for initial summary submission and for final paper submission.
- Submission should be performed by submitting to: ARFTGMMS2019
- Previously unpublished material
- Quantitative Results
- Interest to ARFTG membership
All authors will be notified of acceptance or rejection by e-mail about two weeks after the abstract submission deadline. Accepted papers must be prepared and submitted on time for publication. Authors of accepted manuscripts must submit their final papers by following the instructions for authors of accepted papers .