Introduction

AboutComponents, Circuits, Devices and Systems; Fields, Waves and Electromagnetics; Signal Processing and Analysis
Keywords:Microwave measurements, RF microwave and millimeter-wave instrumentation and measurement,Non-linear,On-wafer,Calibration,VNA,Measurement Uncertainty,
Scope:Measurement techniques, approaches and considerations for frequencies from RF through THz, Measurement based modeling, VNA calibration and measurement uncertainties and other related topics are also covered.
Sponsor Type:1; 9

Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Jan 22

    2023

    to

    Jan 25

    2023

Sponsored By
Automatic RF Techniques Group - ARFTG
IEEE Microwave Theory and Techniques Society
Contact Information
Scan the QR code×
H5
Wechat mini program code
Wechat mini program