AboutComponents, Circuits, Devices and Systems; Fields, Waves and Electromagnetics; Signal Processing and Analysis
Keywords:Microwave measurements, RF microwave and millimeter-wave instrumentation and measurement,Non-linear,On-wafer,Calibration,VNA,Measurement Uncertainty,
Scope:Measurement techniques, approaches and considerations for frequencies from RF through THz, Measurement based modeling, VNA calibration and measurement uncertainties and other related topics are also covered.
Sponsor Type:1; 9

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  • Conference Date

    Jan 22



    Jan 25


Sponsored By
Automatic RF Techniques Group - ARFTG
IEEE Microwave Theory and Techniques Society