Issues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity; power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between Design for Reliability and Design for Security, as security attacks are often fault-based.

Sponsor Type:1; 9


General Chairs:

Stefano Di Carlo
Politecnico di Torino, Torino, Italy

Michael Nicolaidis
TIMA Laboratory, Grenoble, France

Program Chairs:

Dan Alexandrescu
iRoC Technologies, Grenoble, France

Dimitris Gizopoulos
University of Athens, Athens, Greece

Call for paper

Important date

Draft paper submission deadline
Draft paper acceptance notification

Submission Topics

You are invited to participate and submit your contributions to IOLTS’21. The areas of interest include (but are not limited to) the following topics:

Dependable system design
Dependable Computer Architectures
Design for Reliability approaches for Low-Power
Cross-layer reliability approaches
Fault-Tolerant and Fail-Safe systems
Functional safety
Self-Test and Self-Repair
Self-Healing design
Self-Regulating design
Self-Adapting design
Reliability issues of Low-Power Design
Robustness evaluation
Quality, yield, reliability and lifespan issues in nanometer technologies
Variability, Aging, EMI, and Radiation Effects in nanometer technologies
On-line testing techniques for digital, analog and mixed-signal circuits
Self-checking circuits and coding theory
On-line monitoring of current, temperature, process variations, and aging
Power density and overheating issues in nanometer technologies
Field Diagnosis, Maintainability, and Reconfiguration
Design for Security
Fault-based attacks and counter measures
Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular and satellite communications
CAD for robust circuits design

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Important Date
  • Conference Date

    Jun 28



    Jun 30


  • Mar 30 2021

    Draft paper submission deadline

  • May 12 2021

    Draft Paper Acceptance Notification

Sponsored By
IEEE Council on Electronic Design Automation TTTC
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