About Components, Circuits, Devices and Systems
Keywords:Reliability,Testing,Robustness,Safety,Security,Computer architecture,Artificial Intelligence,Embedded Systems,
Scope:The IEEE International Symposium on On-Line Testing and Robust System explores emerging trends and novel concepts related to all aspects of robustness of microelectronic circuits and systems.
Sponsor Type:1; 1

Call for paper

You are invited to participate and submit your contributions to IOLTS’24. The areas of interest include (but are not limited to) the following topics:

  • Dependable system design
  • Dependable Computer Architectures
  • Design-for-Reliability
  • Design for Reliability approaches for Low-Power
  • Cross-layer reliability approaches
  • Fault-Tolerant and Fail-Safe systems
  • Functional safety
  • Self-Test and Self-Repair
  • Self-Healing design
  • Self-Regulating design
  • Self-Adapting design
  • Reliability issues of Low-Power Design
  • Robustness evaluation
  • Quality, yield, reliability, and lifespan issues in nanometer technologies
  • Variability, Aging, EMI, and Radiation Effects in nanometer technologies
  • On-line testing techniques for digital, analog, and mixed-signal circuits
  • Self-checking circuits and coding theory
  • On-line monitoring of current, temperature, process variations, and aging
  • Power density and overheating issues in nanometer technologies
  • Field Diagnosis, Maintainability, and Reconfiguration
  • Design for Security
  • Fault-based attacks and countermeasures
  • Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications
  • CAD for robust circuits design
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Important Date
  • Conference Date

    Jul 03



    Jul 05


  • Jul 05 2024

    Registration deadline

Sponsored By
IEEE Computer Society
IEEE Council on Electronic Design Automation