The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind.
Sponsor Type:1; 1; 9
General Chair
Jin-Fu Li
National Central University
Program Chair
Jing-Jia Liou
National Tsing Hua University
Tutorial Chair
Hung-Pin Wen
National Yang Ming Chiao Tung University
Publicity Chair
Shyue-Kung Lu
National Taiwan University of Science and Technology
Web Chair
Chih-Tsun Huang
National Tsing Hua University
Finance Chair
Tong-Yu Hsieh
National Sun Yan-Set University
Publication Chair
Tsung-Chu Huang
National Changhua University of Education
Local Arrangement Chair
Meng-Lieh Sheu
National Chi Nan University
Topics of interest include (but are not limited to)：
• Analog/Mixed-Signal/RF Test
• ATPG and Fault Simulation
• Design for Testability
• Design and Test for Reliability
• Design and Test for Functional Safety
• System-level Test
• Test for Memory Systems
• Test and Validation for Processors
• Test for Packaging and 3D IC
• Test for IoT Device and System
• Test for Emerging Technologies
• Machine Learning and Test AI
• Hardware-Oriented Security and Trust
• Test Standards
• Test Quality and Economic
• Validation and Verification
• Diagnosis and Silicon Debug
• Wafer-level Tests
• Failure Analysis
• Yield Analysis and Enhancement
Nov 21
2022
Nov 24
2022
Abstract Submission Deadline
Draft Paper Acceptance Notification
2018-10-15 China Hefei
2018 IEEE 27th Asian Test Symposium2017-11-27 China Taipei,China
2017 IEEE 26th Asian Test Symposium2016-11-21 Japan Hiroshima,Japan
2016 IEEE 25th Asian Test Symposium2013-11-18 Taiwan, China
2013 IEEE 22nd Asian Test Symposium
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