The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind.

Sponsor Type:1; 1; 9


General Chair

Jin-Fu Li
National Central University

Program Chair

Jing-Jia Liou
National Tsing Hua University

Tutorial Chair

Hung-Pin Wen
National Yang Ming Chiao Tung University

Publicity Chair

Shyue-Kung Lu
National Taiwan University of Science and Technology

Web Chair

Chih-Tsun Huang
National Tsing Hua University

Finance Chair

Tong-Yu Hsieh
National Sun Yan-Set University

Publication Chair

Tsung-Chu Huang
National Changhua University of Education

Local Arrangement Chair

Meng-Lieh Sheu
National Chi Nan University

Call for paper

Important date

Abstract submission deadline
Draft paper acceptance notification

Submission Topics

Topics of interest include (but are not limited to):

• Analog/Mixed-Signal/RF Test
• ATPG and Fault Simulation
• Design for Testability
• Design and Test for Reliability
• Design and Test for Functional Safety
• System-level Test
• Test for Memory Systems
• Test and Validation for Processors
• Test for Packaging and 3D IC
• Test for IoT Device and System
• Test for Emerging Technologies
• Machine Learning and Test AI
• Hardware-Oriented Security and Trust
• Test Standards
• Test Quality and Economic
• Validation and Verification
• Diagnosis and Silicon Debug
• Wafer-level Tests
• Failure Analysis
• Yield Analysis and Enhancement

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Important Date
  • Conference Date

    Nov 21



    Nov 24


  • Jun 03 2022

    Abstract Submission Deadline

  • Aug 05 2022

    Draft Paper Acceptance Notification

Sponsored By
IEEE Computer Society
IEEE Council on Electronic Design Automation
National Tsing Hua University
Contact Information
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