Introduction

16th IEEE Symp. Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. The technical sessions of the symposium will be held on October 2-4, 2013, within the scenario of the NYU-Abu Dhabi premises in Washington Square. This year the event will be located in the Greenwich Village (also known as "the Village") in Manhattan, New York.

Call for paper

Submission Topics

The Program Committee cordially invites you to participate and submit your contribution to DFT 2011. The conference topics include, but are not limited to, the following: Yield Analysis and Modeling Defect/Fault analysis and models; statistical yield mo
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Oct 02

    2013

    to

    Oct 04

    2013

  • Oct 04 2013

    Registration deadline

Sponsored By
IEEE Computer Society
Contact Information