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For over 25 years, ASMC has been a leading international technical conference for exploring solutions to improve the collective microelectronics manufacturing expertise. Solving the challenges presented by semiconductor manufacturing is an ongoing collaborative effort by users, device makers, equipment and materials suppliers and academia. ASMC provides an unparalleled platform for semiconductor professionals to network and learn the latest information in the practical application of advanced manufacturing strategies and methodologies. ASMC 2015 will feature keynotes, tutorials, technical sessions and a panel discussion which touch on the opportunites and challenges in semiconductor manufacturing. From Fab Optimization to Yield Enhancement, and Enabling Technologies to Advanced Equipment and Materials Processes, ASMC touches on most areas critical to manufacturing.

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Submission Topics

Technical Sessions: · 3D/TSV/Interposer · Advanced Equipment and Materials · Advanced Metrology · Advanced Patterning/Design for Manufacturing · Advanced Process Control (APC) · Contamination Free Manufacturing (CFM) · Defect Inspection and Reduction · Enabling Technologies and Innovative Devices · Equipment Reliability and Productivity Enhancements · Fab Optimization · Yield Enhancement/Learning · Yield Methodologies · And the ever popular Interactive Poster/Reception
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Important Date
  • Conference Date

    May 03



    May 06


  • May 06 2015

    Registration deadline

Sponsored By
Semiconductor Equipment and Materials International (SEMI)
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