The 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS'2018)

The International Conference on Pattern Analysis and Intelligent Systems, would like to become a major point of contact between researchers,  engineers and practitioners from all over the world and  to share ideas and achievements in the theory and practice of intelligent control, artificial intelligence, decision support systems, neural networks, soft computing, data mining and knowledge discovery, opinion mining, ontologies, machine learning, intelligent measurement, cloud computing, Big Data, etc.

All the submitted papers will be reviewed by a minimum of two reviewers, and all the registered papers will be submitted to IEEE for potential inclusion to IEEE Xplore as well as other Abstracting and Indexing (A&I) databases.