Description

The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Hungary (2001, 2005), Austria (2010), Germany (2011,2017), Estonia (2012), Czech Republic (1997, 2002, 2006, 2009, 2013), Poland (1998, 2003, 2007, 2014), Serbia (2015) and Slovakia (2000, 2004, 2008, 2016).

Prospective authors are cordially invited to submit original papers to the Symposium. Papers in English with a length of 6 pages maximum in IEEE conference style are expected. Specialized student and industrial sessions, as well as embedded tutorials, will be organized at the symposium. Accepted papers will be included in the Symposium Proceedings and submitted for inclusion into IEEE Xplore as well as other Abstracting and Indexing databases (WoS, Scopus, etc). An extra work-in-progress session will be targeted to get early feedback on in-progress research and preliminary results (these papers will not be included in IEEE Xplore).

Call for paper

Important Dates

Draft paper submission deadline:2018-01-10

Draft paper acceptance notification:2018-03-15

Final paper submission deadline:2018-03-22

Call for paper description

DDECS covers the areas of design and testing of electronic components, both digital and analog. The topics include the following but are not limited to:

  • SoC and NoC Design and Test
  • ASIC/FPGA Design
  • Built-in Self-Test and Self-Repair
  • Bio-Inspired Hardware
  • Design Verification/Validation
  • Formal Methods in System Design
  • Hardware/Software Co-Design
  • IP-based Design
  • Logic Synthesis
  • Defect/Fault Tolerance and Reliability
  • Design and Test in Nano-Technologies
  • Analog, Mixed-Signal, RF Design and Test
  • ATE Hardware and Software
  • Design for Testability and Diagnosis
  • On-line Testing
  • Embedded Systems
  • Memory, Processor Testing
  • MEMS Testing
  • Physical Design
  • Cyber Physical Systems

Message

Leave a message

Refresh

Contact information

  • Flóra Zieger
  • zieger.flora@itk.ppke.hu

Sponsored By

  • IEEE Computer Society
    IEEE Council on Electronic Design Automation

Organized By

  • Infobionikai Egyesület
    Pazmany Peter Catholic University