Description

The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Czech Republic (1997, 2002, 2006, 2009, 2013), Poland (1998, 2003, 2007, 2014), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), Austria (2010), Germany (2011), Estonia (2012), and Serbia (2015).

 

DDECS 2016 will take place in Košice, the metropolis of eastern Slovakia. It is situated on the river Hornád near the borders with Hungary, Poland and Ukraine. Being the economic and cultural centre, it is the seat of the Košice region parliament, the Slovak Constitutional Court, three universities, various dioceses, and many museums, galleries, and theatres. Košice has a well-preserved historical centre, which is the largest among Slovak towns. In 2013, it was the European Capital of Culture.

Call for paper

Topics of submission

DDECS covers the areas of design and testing of electronic components, both digital and analog. The topics include the following but are not limited to:

  • SoC and NoC Design and Test
  • Design and Test in Nano-Technologies
  • ASIC/FPGA Design
  • Analog, Mixed-Signal, RF Design and Test
  • Built-in Self-Test and Self-Repair
  • ATE Hardware and Software
  • Bio-Inspired Hardware
  • Design for Testability and Diagnosis
  • Design Verification/Validation On-line Testing
  • Formal Methods in System Design Embedded Systems
  • Hardware/Software Co-Design
  • Memory, Processor Testing
  • IP-based Design MEMS Testing
  • Logic Synthesis Physical Design
  • Defect/Fault Tolerance and Reliability
  • Dependable HW/SW Systems

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