Timetable

Timezone：Asia/Shanghai

Day 2,Aug. 19, 2021Thursday

IS1

B2. The Advancement of 1149.10@Industrial Session

19 Aug 2021, 21:05-20 22:05

ZOOM Conference Enter meeting room

Video CONFERENCE Oral Session

Timetable V10 Updated：23 Aug 2021, 15:07

Start End Duration ID Title
Organizer: Yu Huang, Session Chair: Paul Reuter
21:05 21:25 20 71
Requirements of high-speed scan and DFT implementation
Fu Haitao DFT technical expert/HISILICON
Oral Presentation
21:25 21:45 20 11
Solving test challenges in adopting serial scan for production
Ed Seng/Teradyne Inc；Marc Hutner/Teradyne Inc
Oral Presentation
21:45 22:05 20 12
Bringing 1149.10 to life
J-F Cote/Siemens Digital Industries Software；Geir Eide/Siemens Digital Industries Software
Oral Presentation
IS2

B3. Automotive Test and Reliability@Industrial Session

19 Aug 2021, 22:10-20 23:10

ZOOM Conference Enter meeting room

Video CONFERENCE Oral Session

Timetable V10 Updated：23 Aug 2021, 15:07

Start End Duration ID Title
Session Chairs: Yu Huang, Ron Press
22:10 22:30 20 13
Challenges and case-studies in ensuring automotive quality on nanoscale SOCs
David Francis/Texas Instruments, USA
Oral Presentation
22:30 22:50 20 14
Advanced solutions to address automotive test & reliability challenges
Yervant Zorian/Synopsys
Oral Presentation
22:50 23:10 20 15
Combining structural and functional monitoring for improving overall safety and reliability of automotive ICs
Nilanjan Mukherjee/Siemens Digital Industries Software
Oral Presentation
Important Date

  • Conference Date

    Aug 18

    2021

    to

    Aug 20

    2021

  • May 10 2021

    Draft paper submission deadline

  • Aug 16 2021

    Early Bird Registration

  • Aug 19 2021

    Contribution Submission Deadline

  • Aug 20 2021

    Registration deadline

Sponsored By
IEEE
Tongji University
Chinese Computer Federation
Organized By
Tongji University
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