International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers
Nov 09
2019
Nov 15
2019
Final Paper Deadline
Draft paper submission deadline
Abstract Submission Deadline
Draft Paper Acceptance Notification
2020-11-01 United States
2020 IEEE International Test Conference2018-10-30 United States
2018 IEEE International Test Conference2017-10-31 United States
2017 IEEE International Test Conference2016-11-15 United States Fort Worth,USA
2016 IEEE International Test Conference2015-10-06 United States
2015 IEEE International Test Conference2014-10-20 United States
2014 IEEE International Test Conference2013-09-06 United States
2013 IEEE International Test Conference
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