International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

Call for paper

Important date

Abstract submission deadline
Draft paper submission deadline
Draft paper acceptance notification
Final paper submission deadline

Submission Topics

Topics of interest include (not limited to): 

  • 3D/2.5D Test
  • Adaptive Test in Practice
  • ATE/Probe Card Design
  • Advances in Boundary Scan
  • Bring Up
  • Data Driven Methods
  • Data Exchange and Infrastructure
  • Defect-Oriented Testing
  • DFM and Test
  • Diagnosis
  • Economics of Test
  • End-to-End Data Analysis
  • Embedded BIST & DFT
  • Emerging Defect Mechanisms
  • Hardware Security and Trust
  • IoT Testing
  • Jitter, High-Speed I/O and RF Test
  • Known-Good-Die testing
  • Memory Test and Repair
  • MEMS Testing
  • Mixed-Signal and Analog Test
  • New Technologies and Test
  • On-Chip Test Compression
  • Online Test
  • Pre- and Post- Silicon Validation
  • Power Issues in Test
  • Protocol-aware Test
  • Reliability and Resilience
  • Scan Based Test
  • SoC/SiP/NoC Test
  • Silicon Debug
  • Simulation and Test
  • System Test (Applications)
  • System Test (Hardware/Software)
  • Test-to-Design Feedback
  • Test Escape Analysis
  • Test Flow Optimizations
  • Test Generation and Validation
  • Test Resource Partitioning
  • Test Standards
  • Test Time Analysis and Reduction
  • Testing High Speed Optics/Photonics
  • Timing Test
  • Yield Analysis and Optimization
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Oct 31



    Nov 02


  • Mar 20 2017

    Abstract Submission Deadline

  • Mar 20 2017

    Draft paper submission deadline

  • Jun 10 2017

    Draft Paper Acceptance Notification

  • Jul 05 2017

    Final Paper Deadline

Sponsored By
IEEE Dallas Section
Philadelphia Section
Contact Information
Previous Conferences