Introduction
International Test Conference is the world s premier venue dedicated to the electronic test of devices, boards and systems. At ITC, design, test, and yield professionals can confront the challenges the industry faces, and learn how these challenges are being addressed.
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Important Date
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Conference Date
Sep 06
2013
toSep 13
2013
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Sep 13 2013
Registration deadline
Sponsored By
IEEE Computer Society
Contact Information
- IT******@courtesyassoc.com
- -**********
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Previous Conferences
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2020-11-01 United States
2020 IEEE International Test Conference -
2019-11-09 United States
2019 IEEE International Test Conference -
2018-10-30 United States
2018 IEEE International Test Conference -
2017-10-31 United States
2017 IEEE International Test Conference -
2016-11-15 United States Fort Worth,USA
2016 IEEE International Test Conference -
2015-10-06 United States
2015 IEEE International Test Conference -
2014-10-20 United States
2014 IEEE International Test Conference
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